• Orthogonal Defect Classification  - ODC technology was created by Ram Chillarege. ODC can be used to create measurement based on the data and information present in the defects. These ODC created measurement can be used for variety of management and technical purpose. More detail about the subject can be found  here.



• Pairwise Testing - We understand that exhaustive testing is not possible. It is a well known and well understood fact. Most of the time, software exhibit wrong behavior because some of the variable in system are in wrong state. In simpler cases, defects can be triggered by a single variable being in a single state. This is called single-mode fault. In more complex cases, defect will be surfaced only when two variables are in specific state. Pairwise testing can help in finding optimum dataset to cover all the required combination. More details about pairwise testing can be found here.

Have you finished your research and are ready for Patents in Software Testing?